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Introduction

Digital Systems Testing Flow

Design for Testability (DFT): Techniques like scan architectures and Built-In Self-Test (BIST) to simplify debugging. Validate patterns on first silicon

Phase 5: Silicon Bring-up & Debug

• Validate patterns on first silicon.
• Use JTAG debug interface to isolate failures.
• Correlate failing signatures with defect localization.

Combinational vs. Sequential: Contrast deterministic methods like the D-algorithm, PODEM, and FAN with genetic algorithms used for complex sequential circuits. Combinational vs

Acceptance criteria:

Result: